Performance and Feature

The SEM-EX023 provides the power of a competitive SEM but in a self-contained package small enough to fit through the hatches of an aircraft carrier.

Winner of the 2008 R&D Award for Scientific Innovation
Analyzing for wear debris in lubrication fluids is a proven method for predicting mechanism failures of bearings. Electron beam imaging with elemental analysis (EDX) is a powerful non-destructive technique that provides not only the most accurate particle contamination analysis by size and shape parameters, but also reliable identification of component alloys. Populations of wear particles from bearing failures can be automatically sized and characterized with unmatched specificity.
It offers a complete solution to automated particle analysis, a solution that seamlessly integrates electron beam imaging (SEM) and EDX analysis with automated control software and comprehensive data management and data integrity solutions.

Innovation of EXtreme Proportions
Smaller, lighter, easier to operate, and extremely easy to deploy, SEM-EX023 provides laboratory precision and battlefield toughness! In addition to automated particle analysis, can be employed wherever SEM/EDX microanalysis capabilities are required in a rugged mobile form factor manufacturing, mining, pollution control, forensics, heavy equipment maintenance, home land defense, agriculture, geology, archeology and many more.

The Precision You Need for Challenging Environments
Single, Self-Contained Unit
Multi-Layered Environmental Protection
Superior Multi-Stage Vibration Isolation
Advanced SEM Anti-Shock Base
Deployment Ready in Five Minutes
Weighs 700 lbs and Forklift Ready
Small Enough to Fit Through Aircraft Carrier Hatches

Reliability and Versatility
Advanced Power Conditioner with Integrated UPS
Filter Cooling with Easy Access
PSEM HarvesterTM - Automatic & Continuous System Performance Control
PSEM WizardTM Smart Interface for Easier Operation
PSEM Self Diagnostic SystemTM Embedded CPU for Improved Reliability

Superior Particle Analysis Capabilities at an Affordable Price
The SEM-EXP024 is a bench top SEM that provides superior particle analysis capabilities at a price you can't beat. It's clearly designed for "out of the lab" applications, emphasizing speed, reliability and low cost of ownership while requiring no liquid nitrogen. Employing a "design for use" philosophy, has created a compact Scanning Electron Microscope with plenty of power to do your routine automated particle analysis with unmatched ease, speed, and reliability.

Unattended Automated Particle Analysis
Each SEM-EXP024 scanning electron microscope comes equipped with the Perception software suite, which provides a powerful set of tools for microanalysis. Although it is very economically priced, it still comes standard with an LN-free EDX spectrometer and is capable of unattended automated particle analysis. When coupled with optional software such as AFA, or CFA it becomes a fully automated particle analysis system faster, and with greater accuracy and at a lower cost, than can be achieved by other means.

PERFORMANCE SPECIFICATIONS